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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 32,
  • Issue 6,
  • pp. 1221-1227
  • (2014)

Guided-Mode Analysis of Tamm-Plasmon Polariton at Metal–Heterostructure Dielectric Interface

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Abstract

We present a comprehensive analysis for transverse electric (TE) and transverse magnetic (TM) polarized guided Tamm-plasmon polariton (TPP) mode at metal–heterostructure media interface. We explicitly show that the quarter-wavelength stack condition will not be satisfied for TE or TM polarized TPP mode due to the existence of null-point at metal–heterostructure media boundary. Therefore, we propose an alternate route to design TPP waveguide by solving the mode-dispersion relation for different geometrical parameters in a $TiO_2/SiO_2$ bilayer system. The guided TPP-modes (TE and TM) exhibit interesting dispersion characteristics which can be tailored as per the desired application. The group index of TM polarized TPP mode remains constant over a significant wavelength range which results into zero group-velocity dispersion (GVD) at λ ≈ 630 nm wavelength. Also, the propagation length for TM-polarized TPP modes vary between $25\,\mu {m}$ to $50\,\mu {m}$ in a 630–650 nm wavelength range. However, the variation of GVD for TE-modes exhibit a monotonic variation with an exceptionally large ${GVD}\;\approx -3\times 10^{4}\,{ps}/{km $\cdot $ nm}$ around $\lambda =632.8\;{nm}$ .

© 2014 IEEE

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