Abstract
Integrated optics potentially can offer significant cost reductions and
new applications to Optical Coherence Tomography (OCT). We design,
fabricate, and characterize Silicon oxynitride (SiON) elliptic couplers,
which can be used to focus light from a chip into the off-chip environment.
Fizeau-based OCT measurements are performed with elliptic couplers and a
moveable mirror. The optical fields at the output of the elliptic coupler
are simulated and measured. Good agreement is observed between the measured
OCT signal as a function of depth and calculations based on the optical
field at the end of the elliptic coupler.
© 2010 IEEE
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription