Abstract
In this paper, we propose and demonstrate a novel method to characterize
waveguide mode profiles in arrayed waveguide grating (AWG) devices by
utilizing a low-coherence interferometric measurement. Our method calculates
the waveguide mode profile from its far-field diffraction pattern obtained
by the low-coherence interferometric measurement utilizing AWG as a testing
vehicle. The waveguide mode profile and its far-field diffraction pattern
follow the Fourier transformation relationship. Detailed formulation and
analysis procedures are presented in this paper. Experimental results of
waveguide mode profiles for Gaussian waveguides and multimode interference
waveguides are also shown. This method is very effective in characterizing
complex waveguide designs in advanced AWG devices.
© 2009 IEEE
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