Abstract
In this paper, we present a novel ultra-high-speed polymer based electrooptic
modulator that features a profiled, deeply etched cross section. We show that
by profiling the side walls of the modulator and varying the thickness of
the dielectric stack that broadband operation can be achieved whilst maintaining
a very low drive voltage in a compact device. Initially a quasi-TEM analysis
is undertaken in order to determine the modulators response to topographical
variation followed by a full-wave analysis on the optimized device. The full-wave
analysis is employed in order to determine any frequency dispersion effects
with respect to the modulators characteristic impedance $Z_{c}$, microwave effective index $N_{m}$, microwave and dielectric losses $\alpha_{c}$ and $\alpha_{d}$, and the half-wave voltage-length product $V_{\pi}L$.
© 2009 IEEE
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