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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 25,
  • Issue 2,
  • pp. 556-561
  • (2007)

Analysis of Waveguide Discontinuities by a Fourth-Order Finite-Difference Reflective Scheme

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Abstract

A highly accurate reflective scheme is developed for analysis of two-dimensional (2-D) waveguide discontinuities by using the fourth-order finite-difference (FD) formula. It is demonstrated that the new method achieves a significantly higher accuracy/computation cost ratio in comparison with the conventional FD method. Furthermore, the advantage of the new method is more pronounced for the case of high-index-contrast structures with small feature sizes.

© 2007 IEEE

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