Abstract

A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output $I_{\rm pixel}$ current (which is proportional to $I_{\rm oled}$) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although $I_{\rm pixel}$ current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE.

© 2010 IEEE

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