Abstract
Non-crystalline semiconductor based thin film transistors are the building
blocks of large area electronic systems. These devices experience a threshold
voltage shift with time due to prolonged gate bias stress. In this paper we
integrate a recursive model for threshold voltage shift with the open source
BSIM4V4 model of AIM-Spice. This creates a tool for circuit simulation for
TFTs. We demonstrate the integrity of the model using several test cases including
display driver circuits.
© 2014 IEEE
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