ANITA - an FTIR-based Continuous Air Quality Monitoring System on the ISS (International Space Station)

Atle Honne, Henrik Schumann-Olsen, Kristin Kaspersen, Herbert Mosebach, and Dirk Kampf

AIMA1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Space-based Lasers for Remote Sensing Applications

Anthony W. Yu

AIMA2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Fiber Optic Strain Sensors for Chemical and Acoustic Measurements

Hans-Peter Loock

AIMB1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Shape Sensing of Multiple Core Optical Fiber

Mark Froggatt, Justin Klein, and Dawn Gifford

AIMB2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Optical Fiber Gas Sensors using UV and MidIR Spectroscopy for Exhaust Gas Monitoring

E. Lewis, G. Dooly, C. Fitzpatrick, W. Z. Zhao, T. Sun, K. T. V. Grattan, W. B. Lyons, J. Lucas, C. Wei, M. Degner, H. Ewald, S Lochmann, G. Bramann, Flavio Gili, and E. Merlone-Borla

AIMB4 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

In-situ near- and mid-infrared laser spectrometers: From lab to industry

P. Kaspersen, P. Geiser, D. Do Dang, and A. Bohman

AIMC1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Optical measurements in recycling operations

Andreas Nordbryhn

AIMC2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Process Analytical Technology: Bringing Solutions to the Plant Floor

Katherine A. Bakeev

AIMD1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

How to measure the size of tumors: the RECIST standard vs. volumetrics

Zachary H. Levine

AIMD2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Glucose and Other Measurements

Bin Deng(邓 斌), Jerry Goodisman, George Shaheen, Rebecca J. Bussjager, and Joe Chaiken

AIMD3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Laser-Induced Breakdown Spectroscopy (LIBS) for On-line Control in Mining Industry

M. Gaft

AITuA2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Optical Current Sensing

Paul Duncan

AITuB1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

EVOLUTION OF A PLANAR WAVEGUIDE INTERFEROMETRIC SENSOR

D. P. Campbell and J. J. Caspall

AITuB2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Optical Methods for Sensing Temperature

B. Rami Reddy

AITuB3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Surface Metrology using an Elastomeric Sensor

Micah K. Johnson and Edward H. Adelson

AITuB4 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Optical Inspection and Metrology in Semiconductor Manufacturing

Mehdi Vaez-Iravani

AITuC1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Improving Yield in Wafer Level Cameras through Specialized Design and Process Monitoring

Kenneth Kubala and Robert Bates

AITuC2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Diffractive Optics for High-throughput Screening

Ethan Schonbrun

AITuC3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Raman Chemical Imaging of Explosive-Contaminated Fingerprints for Forensic Attribution

Augustus W. Fountain, Ashish Tripathi, Erik D. Emmons, Phillip G. Wilcox, Jason A. Guicheteau, Darren K. Emge, and Steven D. Christesen

AIWA1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

New Technologies in Field Soil Survey

David C. Weindorf, Somsubhra Chakraborty, Yuanda Zhu, John Galbraith, and Yufeng Ge

AIWA2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

A Quantitative UV Chemometric Model for the Determination of Zeaxanthin Cis and Trans Isomers

James P. Barren, Norman G. Rushing, Anthony P. van den Hombergh, and Julie C. Londry

AIWA3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

The Picosecond IR Laser (PIRL) Scalpel: Fundamental Limits to Minimally Invasive Surgery and Biodiagnostics

Saeid Amini-Nik, Darren Kraemer, Michael L Cowan M., Keith Gunaratne, Puviindran Nadesan, Ben A. Alman, and R. J. Dwayne Miller

AIWB1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Advances in High Power Fiber Lasers for Defense Applications

Mike O’Connor

AIWB2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

New Wide Angle Electro-Optic Laser Scanners Enable Optical Sensors on Previously Inaccessible Platforms

Scott R. Davis, Scott D. Rommel, Seth Johnson, George Farca, Neil Rebolledo, Setphanie Selewyn, and Michael H. Anderson

AIWB3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Image Quality Estimate of a Head Mounted Display Apparatus for Low Vision Aids

Jean-François Lavigne, Fabien Claveau, Stéphane Melançon, François Lagacé, Mélanie Leclerc, and Donald Prevost

JTuB6 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Color Spaces Analysis of Photoelasticity Images of Plastics Thin Films

Alejandro Restrepo-Martínez and Francisco López

JTuB7 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

FTS Measurements of Uranium Emission Lines in the Near-Infrared and their Application to the Search for Earth-Mass Exoplanets

Stephen L. Redman, James E. Lawler, Gillian Nave, Lawrence W. Ramsey, and Suvrath Mahadevan

JWA1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Performance model of Sitelle, a wide-field imaging FTS for the study of visible emission lines of astronomical objects.

Julie Mandar, Frédéric Grandmont, Simon Thibault, and Laurent Drissen

JWA2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Ground-based FTIR Measurements and Modeling of Tropospheric Trace Gases Over Toronto

Cynthia Whaley, Kimberly Strong, Dylan Jones, and Dan Weaver

JWA3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Concepts of Fourier transform spectroscopy using a Sagnac interferometer

Eyal Schwartz and Stephen G. Lipson

JWA5 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Obliquity Effects in the Herschel/SPIRE Imaging Fourier Transform Spectrometer

Gibion Makiwa, Locke D. Spencer, David A. Naylor, and Brad G. Gom

JWA6 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Phase Correction of Fourier Transform Spectrometer Interferograms by Optimization of the Local Oscillator Phase Angle Term

K.J. Conroy, K.P. Kirkbride, and C.C. Harb

JWA7 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Sampling Jitter Reduction in CCD-Based Imaging FTS with Predictive Centered Triggering of Detector Integration

Jean-Philippe Déry, Jérôme Genest, and Martin Chanberland

JWA8 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Recovery of Exoplanetary Signals in Re-dispersed Speckle Clutter

Szymon Gladysz and Erez N. Ribak

JWA10 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Kerr-induced nonlinear focal shift measurements

Georges Boudebs

JWA11 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Improvement Of Image Resolution Beyond Classical Limit By Phase-Sensitive Optical Parametric Amplifier

Z. Huang, D. French, H-Y. Pao, and I. Jovanovic

JWA12 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Numerical Simulations of Metamaterial-based Infrared Sensor for Remote Environmental Monitoring

Alexander K. Popov and Sergey A. Myslivets

JWA13 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Widefield ultrastable heterodyne interferometry using a custom CMOS modulated light camera

Rikesh Patel, Matt Clark, and Samuel Achamfuo-Yeboah

JWA14 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Tunable Single Pixel MEMS Fabry-Perot Interferometer

Annette Rivas, John Kerekes, and Alan Raisanen

JWA15 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Aircraft Measurements of the Aerosol Direct Radiative Effect

Samuel LeBlanc, K. Sebastian Schmidt, and Peter Pilewskie

JWA16 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Fourier Synthesis in Classical Ghost Imaging

Tomohiro Shirai, Henri Kellock, Tero Setälä, and Ari T. Friberg

JWA17 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Error Budget and Estimation in Ultraspectral Sounding Retrieval

Daniel K. Zhou, Allen M. Larar, Xu Liu, William L. Smith, and L. Larrabee Strow

JWA19 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Using Rotational Raman Scattering in the Atmosphere for Satellite Retrieval of Aerosol Properties

Alexander Vasilkov, Joanna Joiner, Omar Torres, Changwoo Ahn, and Robert Spurr

JWA20 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Longwave Radiative Energetics of Mineral Dust Aerosol

R.A. Hansell, S.C. Tsay, N.C. Hsu, Q. Ji, S.W. Bell, W. Zhang, J. Huang, Z. Li, and H. Chen

JWA21 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Spectral Calibration of the CrIS Instrument On-Orbit

Denise Hagan, Degui Gu, and Xia-Lin Ma

JWA22 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Validation of IASI Temperature and Water Vapor Retrievals with Global Radiosonde Measurements and Model Forecasts

Murty Divakarla, Antonia Gambacorta, Christopher Barnet, Mitchell Goldberg, Eric Maddy, Tom King, Walter Wolf, Nick Nalli, Kexin Zhang, and Hua Xie

JWA25 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Solar Adaptive Optics System and Observations at the Hida Observatory

Noriaki Miura, Fumihito Yokoyama, Jun’ichi Miyazaki, Susumu Kuwamura, Naoshi Baba, Yoichiro Hanaoka, Satoru Ueno, Yoshikazu Nakatani, Shin’ichi Nagata, Reizaburou Kitai, Kiyoshi Ichimoto, and Hideki Takami

JWA26 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Halo Measurement Using Phase-Sorting Interferometry

Johanan L. Codona, Matthew Kenworthy, and Michael Hart

JWA27 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Bilateral cone density distribution analyzed with a compact Adaptive Optics ophthalmoscope

Marco Lombardo, Giuseppe Lombardo, Domenico Schiano Lomoriello, Pietro Ducoli, and Sebastiano Serrao

JWA28 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

A/V Ratio as Predicted by Full Width at Half Maximum and by Blood Vessel Tracking in Presence of Ocular Aberrations

Varis Karitans, Maris Ozolinsh, Sergejs Fomins, Nikita Iroshnikov, and Andrey Larichev

JWA29 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

High resolution Hartmann Wavefront sensor for EUV Lithography system

A. Polo, F. Bociort, S.F. Pereira, and H.P. Urbach

JWA30 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Kalman and H-infinity controllers for GeMS

I. Rodriguez, B. Neichel, A. Guesalaga, F. Rigaut, and D. Guzman

JWA32 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Optofluidic Microscopy: Chip-scale imaging cell cytometry

Guoan Zheng, Seung Ah Lee, Sean Pang, Chao Han, Lapman Lee, and Changhuei Yang

JWB1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

Autonomous Hyperspectral Imaging in Real-Time

Patrick Treado, Matthew Nelson, and Robert C. Schweitzer

JWB2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

A Compact Probe for β+-Emitting Radiotracer Detection in Surgery, Biopsy and Medical Diagnostics based on Silicon Photomultipliers

Christian Mester, Claudio Bruschini, Patricia Magro, Nicolas Demartines, Vincent Dunet, Eugene Grigoriev, Anatoli Konoplyannikov, Maurice Matter, John O. Prior, and Edoardo Charbon

JWB3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

SIM and Deflectometry: New Tools to Acquire Beautiful, SEM-like 3D Images

Gerd Häusler, Markus Vogel, Zheng Yang, Alexander Kessel, and Christian Faber

JWC1 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

An algorithm for high-speed 3-D profilometry

Benjamin Braker and Eric D. Moore

JWC2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF

3D Far-field Optical Nanoscopy and Aperiodic Volume Optics

Rafael Piestun

JWC3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2011 View: PDF