Measurement of the adjustable slight roughness emulated by a spatial light modulator employing the vortex beam speckle pattern

Can Cui; Zhi Wang; Xiangkong Zhan; Jian Wang; Lanlan Liu; Zhiyong Li; Chongqing Wu

doi:10.1364/AO.385176

Applied Optics
Vol. 59,
Issue 12,
pp. 3630-3635
(2020)
•https://doi.org/10.1364/AO.385176

Measurement of the adjustable slight roughness emulated by a spatial light modulator employing the vortex beam speckle pattern

Can Cui, Zhi Wang, Xiangkong Zhan, Jian Wang, Lanlan Liu, Zhiyong Li, and Chongqing Wu

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Can Cui, Zhi Wang, Xiangkong Zhan, Jian Wang, Lanlan Liu, Zhiyong Li, and Chongqing Wu, "Measurement of the adjustable slight roughness emulated by a spatial light modulator employing the vortex beam speckle pattern," Appl. Opt. 59, 3630-3635 (2020)

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Table of Contents Category
- Fourier Optics and Optical Processing
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About this Article
History
- Original Manuscript: December 5, 2019
- Revised Manuscript: March 10, 2020
- Manuscript Accepted: March 17, 2020
- Published: April 16, 2020

Abstract

In this paper, we analyze the speckle patterns generated by the scattering of optical vortex on different roughness surfaces, compared with those produced by Gaussian light, where the roughness is emulated by a spatial light modulator and adjustable. The scheme and experiments demonstrate an improvement with the vortex beam, especially for slight roughness measurements. In addition, since the topological charge used to produce speckle patterns has a great influence on the speckle size and can be optimized to adjust it for different object measurements, we also investigate how the roughness depends on the topological charge.

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$L$	Fitted Equation	Test Surfaces (µm)	Measured Roughness (µm)	Error (%)
0	$y_{0} = - 0.25 x + 161.4$	0.0081	0.8278	10,120
		0.2106	0.5766	174
1	$y_{1} = - 13.2 x + 141.2$	0.0081	0.0094	16
		0.2106	0.1920	9
2	$y_{2} = - 19.5 x + 126.1$	0.0081	0.0082	0.7
		0.2106	0.1892	10.1
3	$y_{3} = - 11.3 x + 107.8$	0.0081	0.0112	38.2
		0.2106	0.2235	6.1

$L$	Fitted Equation	Test Surfaces (µm)	Measured Roughness (µm)	Error (%)
0	$y_{0} = 43.5 + 1.5 \cos (11.2 x) - 0.3 \sin (11.2 x)$	0.0081	0.0210	159
		0.2106	0.2001	5
1	$y_{1} = 44.5 + 2.1 \cos (11.6 x) - 0.2 \sin (11.6 x)$	0.0081	0.0038	53
		0.2106	0.2077	1
2	$y_{2} = 41.5 + 1.8 \cos (12.1 x) - 0.01 \sin (12.1 x)$	0.0081	0.0123	52
		0.2106	0.2038	3
3	$y_{3} = 40.3 + 1.7 \cos (11.8 x) - 0.06 \sin (11.8 x)$	0.0081	0.0117	44
		0.2106	0.2053	2

$L$	Fitted Equation	Test Surfaces (µm)	Measured Roughness (µm)	Error (%)
0	$y_{0} = - 0.25 x + 161.4$	0.0081	0.8278	10,120
		0.2106	0.5766	174
1	$y_{1} = - 13.2 x + 141.2$	0.0081	0.0094	16
		0.2106	0.1920	9
2	$y_{2} = - 19.5 x + 126.1$	0.0081	0.0082	0.7
		0.2106	0.1892	10.1
3	$y_{3} = - 11.3 x + 107.8$	0.0081	0.0112	38.2
		0.2106	0.2235	6.1

$L$	Fitted Equation	Test Surfaces (µm)	Measured Roughness (µm)	Error (%)
0	$y_{0} = 43.5 + 1.5 \cos (11.2 x) - 0.3 \sin (11.2 x)$	0.0081	0.0210	159
		0.2106	0.2001	5
1	$y_{1} = 44.5 + 2.1 \cos (11.6 x) - 0.2 \sin (11.6 x)$	0.0081	0.0038	53
		0.2106	0.2077	1
2	$y_{2} = 41.5 + 1.8 \cos (12.1 x) - 0.01 \sin (12.1 x)$	0.0081	0.0123	52
		0.2106	0.2038	3
3	$y_{3} = 40.3 + 1.7 \cos (11.8 x) - 0.06 \sin (11.8 x)$	0.0081	0.0117	44
		0.2106	0.2053	2

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Equations (5)

Applied Optics