Abstract
We present optical modeling of superconducting nanowire single photon detector devices using an analytical approach based on the transfer matrix method. We find that the optimal dielectric layer thicknesses vary slightly with the thickness and fill factor of the NbN layer and explore novel device geometries that can be described as a stack of thin films, such as devices on multilayered substrates, free-standing membranes, and optical fiber facets. In addition, the analytical results here show the importance of accounting for coherence correctly when an integrated cavity is included in the device structure and the relative insignificance of an anti-reflection coating in most cases.
© 2018 Optical Society of America
Full Article | PDF ArticleCorrections
Kristen A. Sunter and Karl K. Berggren, "Optical modeling of superconducting nanowire single photon detectors using the transfer matrix method: publisher’s note," Appl. Opt. 57, 5672-5672 (2018)https://opg.optica.org/ao/abstract.cfm?uri=ao-57-20-5672
20 June 2018: Corrections were made to the Funding and Acknowledgment sections.
More Like This
Mária Csete, Áron Sipos, Faraz Najafi, Xiaolong Hu, and Karl K. Berggren
Appl. Opt. 50(31) 5949-5956 (2011)
Anna Mukhtarova, Luca Redaelli, Dibyendu Hazra, Houssaine Machhadani, Stéphane Lequien, Max Hofheinz, Jean-Luc Thomassin, Frederic Gustavo, Julien Zichi, Val Zwiller, Eva Monroy, and Jean-Michel Gérard
Opt. Express 26(13) 17697-17704 (2018)
Vikas Anant, Andrew J. Kerman, Eric A. Dauler, Joel K. W. Yang, Kristine M. Rosfjord, and Karl K. Berggren
Opt. Express 16(14) 10750-10761 (2008)