1 October 2003, Volume 42, Issue 28, pp. 5621-5792  
24 articles

Irradiation stability of silicon photodiodes for extreme-ultraviolet radiation

Appl. Opt. 42(28), 5621-5626 (2003)  View: HTML | PDF

Three-dimensional image construction by curved surface scratches

Appl. Opt. 42(28), 5627-5633 (2003)  View: HTML | PDF

Sensitivity errors in interferometric deformation metrology

Appl. Opt. 42(28), 5634-5641 (2003)  View: HTML | PDF

Quasi-achromatic laser Doppler anemometry systems based on a diffractive beam splitter

Appl. Opt. 42(28), 5642-5648 (2003)  View: HTML | PDF

Realization of a multichannel integrated Young interferometer chemical sensor

Appl. Opt. 42(28), 5649-5660 (2003)  View: HTML | PDF

Measurement by multidirectional interferometers of the position and orientation of a positioning stage

Appl. Opt. 42(28), 5661-5669 (2003)  View: HTML | PDF

Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry—application to absolute long gauge block measurement

Appl. Opt. 42(28), 5670-5678 (2003)  View: HTML | PDF

Design criteria and optical characteristics of one-dimensional photonic crystals based on periodically grooved silicon

Appl. Opt. 42(28), 5679-5683 (2003)  View: HTML | PDF

Dichroic ultraviolet light filters

Appl. Opt. 42(28), 5684-5692 (2003)  View: HTML | PDF

Three-dimensional imaging of microspheres with confocal and conventional polarization microscopes

Appl. Opt. 42(28), 5693-5700 (2003)  View: HTML | PDF

Lens based on the use of left-handed materials

Appl. Opt. 42(28), 5701-5705 (2003)  View: HTML | PDF

Wet-etch figuring for precision optical contouring

Appl. Opt. 42(28), 5706-5713 (2003)  View: HTML | PDF

Optical resonances in periodic surface arrays of metallic patches

Appl. Opt. 42(28), 5714-5721 (2003)  View: HTML | PDF

Polarization control by use of the electro-optic effect in periodically poled lithium niobate

Appl. Opt. 42(28), 5722-5725 (2003)  View: HTML | PDF

Theoretical model of the polarization properties of the retinal nerve fiber layer in reflection

Appl. Opt. 42(28), 5726-5736 (2003)  View: HTML | PDF

Diattenuation and polarization preservation of retinal nerve fiber layer reflectance

Appl. Opt. 42(28), 5737-5743 (2003)  View: HTML | PDF

Spatial pattern separation of chemicals and frequency-independent components by terahertz spectroscopic imaging

Appl. Opt. 42(28), 5744-5748 (2003)  View: HTML | PDF

Ion-beam etching for the precise manufacture of optical coatings: erratum

Appl. Opt. 42(28), 5749-5749 (2003)  View: HTML | PDF

Design and performance of capping layers for extreme-ultraviolet multilayer mirrors

Appl. Opt. 42(28), 5750-5758 (2003)  View: HTML | PDF

Efficient characterization of regional mesenteric blood flow by use of laser speckle imaging

Appl. Opt. 42(28), 5759-5764 (2003)  View: HTML | PDF

Optical forces for noninvasive cellular analysis

Appl. Opt. 42(28), 5765-5773 (2003)  View: HTML | PDF

Interferometric optical sensor for measuring glucose concentration

Appl. Opt. 42(28), 5774-5776 (2003)  View: HTML | PDF

Measurement and analysis of light distribution in intralipid-10% at 650 nm

Appl. Opt. 42(28), 5777-5784 (2003)  View: HTML | PDF

Evaluation of optical properties of highly scattering media by moments of distributions of times of flight of photons

Appl. Opt. 42(28), 5785-5792 (2003)  View: HTML | PDF