Patent Reviews: 5,000,566; 5,004,310; 5,007,721; 5,134,882; 5,155,553; 5,159,656; 5,137,353; 5,166,813; 5,168,386; 5,170,049; 5,171,994; 5,172,000; 5,172,257; 5,173,598; 5,175,647; 5,175,755; 5,181,012; 5,181,224; 5,182,659; 5,185,647; 5,187,358; 5,187,359; 5,187,360; 5,192,980; 5,198,659; 5,200,861

B. J. Howell, I. J. Abramovitz, S. F. Jacobs, A. Mann, D. L. Sullivan, R. Asthelmer, R. Kingslake, H. Miranda, S. K. Tchejeyan, A. Brunsting, P. M. Kuhn, G. L. Mitchell, W. J. Tomlinson, J. A. Decker, W. H. Lee, R. Prescott, W. Vaughan, D. C. Gilkeson, D. C. Leiner, L. S. Sadovnik, P. Wakeling, M. Handschy, E. Loewen, J. J. J. Staunton, D. E. Williamson, and R. L. Hilllard

Appl. Opt. 32(25), 4678-4682 (1993)  View: HTML | PDF

Submicrometer displacement sensing using inner-product multimode fiber speckle fields

Francis T. S. Yu, Meiyuan Wen, Shizhuo Yin, and Chii-Maw Uang

Appl. Opt. 32(25), 4685-4689 (1993)  View: HTML | PDF

Profile testing of spherical surfaces by laser deflectometry

Martha Rosete-Aguilar and Rufino Díaz-Uribe

Appl. Opt. 32(25), 4690-4697 (1993)  View: HTML | PDF

Absolute testing of flats by using even and odd functions

Chiayu Ai and James C. Wyant

Appl. Opt. 32(25), 4698-4705 (1993)  View: HTML | PDF

Diffraction of apertured Gaussian beams: solution by expansion in Chebyshev polynomials

Gregory Toker, Andrei Brunfeld, and Joseph Shamir

Appl. Opt. 32(25), 4706-4712 (1993)  View: HTML | PDF

Interferometric methods with enhanced sensitivity by optical/digital fringe multiplication

Bongtae Han

Appl. Opt. 32(25), 4713-4718 (1993)  View: HTML | PDF

Electronic shear interferometry: application of a (double-) pulsed laser

Rudie Spooren, Astrid Aksnes Dyrseth, and Mario Vaz

Appl. Opt. 32(25), 4719-4727 (1993)  View: HTML | PDF

Three-dimensional displacement measurement by a holospeckle interferometry method

W. Z. L. Zhuang, J. P. Baird, H. M. Williamson, and R. K. Clark

Appl. Opt. 32(25), 4728-4737 (1993)  View: HTML | PDF

Vector formulation for interferogram surface fitting

David J. Fischer, John T. O’Bryan, Robert Lopez, and H. Philip Stahl

Appl. Opt. 32(25), 4738-4743 (1993)  View: HTML | PDF

Interference microscopy and Fourier fringe analysis applied to measuring the spatial refractive-index distribution

S. Kostianovski, S. G. Lipson, and E. N. Ribak

Appl. Opt. 32(25), 4744-4750 (1993)  View: HTML | PDF

Nonwalk-off multipass Twyman–Green interferometer

William C. Sweatt

Appl. Opt. 32(25), 4751-4754 (1993)  View: HTML | PDF

Diffuse reflecting surfaces for the infrared and far infrared

Xiaoming Wang and Jerald R. Izatt

Appl. Opt. 32(25), 4755-4762 (1993)  View: HTML | PDF

Design of gradient-index lens systems for laser beam reshaping

Cheng Wang and David L. Shealy

Appl. Opt. 32(25), 4763-4769 (1993)  View: HTML | PDF

Analytic design of hybrid diffractive–refractive achromats

N. Davidson, A. A. Friesem, and E. Hasman

Appl. Opt. 32(25), 4770-4774 (1993)  View: HTML | PDF

Curved kinoform lenses for stigmatic imaging of axial objects

L. N. Hazra, Y. Han, and C. Delisle

Appl. Opt. 32(25), 4775-4784 (1993)  View: HTML | PDF

Fourier transform refractometry using multichannel detection

Caesar Saloma, Vincent Darla, and Jesus Muñoz

Appl. Opt. 32(25), 4785-4789 (1993)  View: HTML | PDF

Estimation of the potential of a fluorescence thermometer for Diesel spray studies

M. Megahed

Appl. Opt. 32(25), 4790-4796 (1993)  View: HTML | PDF

Differential wax–wane focus servo

Mark S. Wang and Tom D. Milster

Appl. Opt. 32(25), 4797-4807 (1993)  View: HTML | PDF

Simulation of fan-beam-type optical computed-tomography imaging of strongly scattering and weakly absorbing media

Yukio Yamada, Yasuo Hasegawa, and Yutaka Yamashita

Appl. Opt. 32(25), 4808-4814 (1993)  View: HTML | PDF

Calibration of 254-nm irradiance based on the silicon photodiode self-calibration technique

K. Ohkubo, Y. Ohno, and Y. Nakagawa

Appl. Opt. 32(25), 4815-4821 (1993)  View: HTML | PDF

Dynamic range enhancement of Fourier transform infrared spectrum measurement using delta sigma modulation

Kei-ichiroh Minami and Satoshi Kawata

Appl. Opt. 32(25), 4822-4827 (1993)  View: HTML | PDF

Method of accurately measuring the spectral line tilt in the Ebert spectrograph

Ryszard S. Trawiński, Jolanta Domyslawska, Roman Ciurylo, and Andrzej Bielski

Appl. Opt. 32(25), 4828-4830 (1993)  View: HTML | PDF

Rugate filter sidelobe suppression using half-apodization

Hassan A. Abu-Safia, Abdullah I. Al-Sharif, and Ibrahim O. Abu Aljarayesh

Appl. Opt. 32(25), 4831-4835 (1993)  View: HTML | PDF

Circular, variable, broad-bandpass filters with induced transmission at 200–1100 nm

Shumei Yang

Appl. Opt. 32(25), 4836-4842 (1993)  View: HTML | PDF

Analytical solutions for zero-phase-shift transparent coatings on metallic reflectors at 10.6 μm

E. Cojocaru

Appl. Opt. 32(25), 4843-4845 (1993)  View: HTML | PDF

Low-radiation-damage multilayer coatings for the soft-x-ray region

W. R. Hunter and J. F. Seely

Appl. Opt. 32(25), 4846-4851 (1993)  View: HTML | PDF

Long-term stability of a Mo/Si multilayer structure

T. W. Barbee, J. C. Rife, W. R. Hunter, M. P. Kowalski, R. G. Cruddace, and J. F. Seely

Appl. Opt. 32(25), 4852-4854 (1993)  View: HTML | PDF

Tin–polyimide and indium–polyimide thin-film composites as soft x-ray bandpass filters

Stephen F. Powell, Maxwell J. Allen, and Thomas D. Willis

Appl. Opt. 32(25), 4855-4859 (1993)  View: HTML | PDF

System of optical noncontact microtopography

Manuel F. M. Costa and Jose B. Almeida

Appl. Opt. 32(25), 4860-4863 (1993)  View: HTML | PDF

Control of the tip–surface distance in near-field optical microscopy

S. I. Bozhevolnyi, O. Keller, and M. Xiao

Appl. Opt. 32(25), 4864-4868 (1993)  View: HTML | PDF

Model of a new temperature-compensated optical current sensor using Bi₁₂SiO₂₀

C. M. M. van den Tempel

Appl. Opt. 32(25), 4869-4874 (1993)  View: HTML | PDF

Holographic spherical gratings: a new family of quasi-stigmatic designs for the Rowland-circle mounting

Robert Grange

Appl. Opt. 32(25), 4875-4880 (1993)  View: HTML | PDF

Deformed ellipsoidal gratings for far-ultraviolet spectrographs: analytic optimization

David Content and Takeshi Namioka

Appl. Opt. 32(25), 4881-4889 (1993)  View: HTML | PDF

On-blaze operation of a Mo/Si multilayer-coated, concave diffraction grating in the 136–142-Å wavelength region and near normal incidence

J. F. Seely, M. P. Kowalski, W. R. Hunter, J. C. Rife, T. W. Barbee, G. E. Holland, C. N. Boyer, and C. M. Brown

Appl. Opt. 32(25), 4890-4897 (1993)  View: HTML | PDF

Surface-roughness measurement using Fourier transformation of doubly scattered speckle pattern

Kiyoshi Nakagawa, Takeaki Yoshimura, and Takumi Minemoto

Appl. Opt. 32(25), 4898-4903 (1993)  View: HTML | PDF

Testing an optical window of a small wedge angle: effect of multiple reflections

Chiayu Ai and James C. Wyant

Appl. Opt. 32(25), 4904-4912 (1993)  View: HTML | PDF

Output beam intensity noise induced by fiber perturbations in a fiber-linked laser

Jeffrey J. Hamilton, Yi Pang, and Jean-Paul Richard

Appl. Opt. 32(25), 4913-4915 (1993)  View: HTML | PDF

Fabrication of buried channel waveguides on silicon substrates using spin-on glass

A. S. Holmes, R. R. A. Syms, Ming Li, and Mino Green

Appl. Opt. 32(25), 4916-4921 (1993)  View: HTML | PDF

Effects of finite stylus width in surface contact profilometry

K. A. O’Donnell

Appl. Opt. 32(25), 4922-4928 (1993)  View: HTML | PDF

Analysis of shearogram reconstruction

S. L. Toh, C. J. Tay, H. M. Shang, and Q. Y. Lin

Appl. Opt. 32(25), 4929-4933 (1993)  View: HTML | PDF