Patent Reviews: 4,906,070; 4,906,087; 4,913,524; 4,917,447; 4,921,338; 4,953,922; 4,962,311; 4,974,944; 4,979,819; 4,979,821

B. J. Howell

Appl. Opt. 30(22), 3080-3081 (1991)  View: PDF

Formula for the future

Anne C. Roark

Appl. Opt. 30(22), 3082-3086 (1991)  View: HTML | PDF

Delayed elastic effects in the glass ceramics Zerodur and ULE at room temperature

John W. Pepi and Donald Golini

Appl. Opt. 30(22), 3087-3088 (1991)  View: HTML | PDF

Fourteen-decade photocurrent measurements with large-area silicon photodiodes at room temperature

G. Eppeldauer and J. E. Hardis

Appl. Opt. 30(22), 3091-3099 (1991)  View: HTML | PDF

Image plane detector for Fabry–Perot interferometers: physical model and improvement with anticoincidence detection

Paul B. Hays and Jinxue Wang

Appl. Opt. 30(22), 3100-3107 (1991)  View: HTML | PDF

Multiplex Fabry–Perot interferometer

Paul B. Hays and Hilary E. Snell

Appl. Opt. 30(22), 3108-3113 (1991)  View: HTML | PDF

High-resolution spectrometry with a masked Fabry–Perot interferometer

Luca Crescentini

Appl. Opt. 30(22), 3114-3118 (1991)  View: HTML | PDF

Influence of spherical aberration of an interferometric system on the measurement error in the case of a finite fringe observation field

Romuald JóŸwicki

Appl. Opt. 30(22), 3119-3125 (1991)  View: HTML | PDF

Influence of aberrations of Fizeau interferometer elements on measurement errors

Romuald JóŸwicki

Appl. Opt. 30(22), 3126-3132 (1991)  View: HTML | PDF

Prototype Michelson interferometer with Fabry–Perot cavities

David Shoemaker, Peter Fritschel, Joseph Giaime, Nelson Christensen, and Rainer Weiss

Appl. Opt. 30(22), 3133-3138 (1991)  View: HTML | PDF

Two-wavelength double heterodyne interferometry using a matched grating technique

Zoran Sodnik, Edgar Fischer, Thomas Ittner, and Hans J. Tiziani

Appl. Opt. 30(22), 3139-3144 (1991)  View: HTML | PDF

Estimation of optical parameters in a living tissue by solving the inverse problem of the multiflux radiative transfer

Leonid Fukshansky, Nina Fukshansky-Kazarinova, and Alexander Martinez v. Remisowsky

Appl. Opt. 30(22), 3145-3153 (1991)  View: HTML | PDF

Effects of high-numerical-aperture focusing on the state of polarization in optical and magneto-optic data storage systems

M. Mansuripur

Appl. Opt. 30(22), 3154-3162 (1991)  View: HTML | PDF

Procedure for computer-controlled milling of accurate surfaces of revolution for millimeter and far-infrared mirrors

Louisa Emmons and Robert de Zafra

Appl. Opt. 30(22), 3163-3165 (1991)  View: HTML | PDF

Properties of chemical-vapor-deposited silicon carbide for optics applications in severe environments

Jitendra S. Goela, Michael A. Pickering, Raymond L. Taylor, Brian W. Murray, and Arthur Lompado

Appl. Opt. 30(22), 3166-3175 (1991)  View: HTML | PDF

Attenuated-total-reflection technique for the determination of optical constants

L. E. Regalado, R. Machorro, and J. M. Siqueiros

Appl. Opt. 30(22), 3176-3180 (1991)  View: HTML | PDF

Absolute measurements of diffuse reflectance in the α°/d configuration

Dan Sheffer, Uri P. Oppenheim, and Adam D. Devir

Appl. Opt. 30(22), 3181-3185 (1991)  View: HTML | PDF

Infrared optical constants and roughness factor functions determination: the HTHRTR method

Marta Klanjšek Gunde and Boris Aleksandrov

Appl. Opt. 30(22), 3186-3196 (1991)  View: HTML | PDF

Measurement of angular velocity using speckle photography

C. S. Narayanamurthy

Appl. Opt. 30(22), 3197-3199 (1991)  View: HTML | PDF

Profile measurement of an aspheric cylindrical surface from retroreflection

Ding-tin Lin and Der-Shen Wan

Appl. Opt. 30(22), 3200-3204 (1991)  View: HTML | PDF

Profile measuring method based on reflection characteristics at a critical angle in a right-angle prism

Tetsuya Matsumoto, Yoichi Kitagawa, Masaaki Adachi, and Takumi Minemoto

Appl. Opt. 30(22), 3205-3209 (1991)  View: HTML | PDF

Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry

Julio R. Blanco and Patrick J. McMarr

Appl. Opt. 30(22), 3210-3220 (1991)  View: HTML | PDF

Light-scattering measurement of the rms slopes of rough surfaces

Lin-xiang Cao, Theodore V. Vorburger, A. George Lieberman, and Thomas R. Lettieri

Appl. Opt. 30(22), 3221-3227 (1991)  View: HTML | PDF

Optical methods for thickness measurements on thin metal films

Peter Pokrowsky

Appl. Opt. 30(22), 3228-3232 (1991)  View: HTML | PDF

TiO₂–SiO₂ mixed films prepared by the fast alternating sputter method

Shiuh Chao, Cheng-Kuei Chang, and Jyh-Shin Chen

Appl. Opt. 30(22), 3233-3237 (1991)  View: HTML | PDF

Adaptation of the refractive indices of antireflection coatings to other surrounding media

Cees J. van der Laan and Hans J. Frankena

Appl. Opt. 30(22), 3238-3241 (1991)  View: HTML | PDF

Sidelobe suppression of the point–spread function in annular-pupil optical systems

Osamu Nakamura and Kouji Toyoda

Appl. Opt. 30(22), 3242-3245 (1991)  View: HTML | PDF

Singly reflected skew rays inside a hollow tube: an exact cardiold solution for incident rim rays

John N. Pike

Appl. Opt. 30(22), 3246-3252 (1991)  View: HTML | PDF

Direct imaging of nonsolar planets with infrared telescopes using apodized coronagraphs

Steven M. Watson, James P. Mills, Steven L. Gaiser, and David J. Diner

Appl. Opt. 30(22), 3253-3262 (1991)  View: HTML | PDF