Abstract
Xerographic properties were measured for vitreous bismuth–selenium films prepared by flash evaporation techniques in the 0–3 at. % Bi range. Optimum sensitivity was observed in the 1.1 at. % Bi region with broad, relatively flat spectral response from 4000 Å to beyond 7000 Å and quantum gain values of 0.2 to 0.06, respectively, at these wavelengths with fields of 2 × 105 V/cm. The variation of initial xerographic discharge rates was also determined as a function of applied field and light intensity. Mechanical flexibility approximately equivalent to that of selenium was indicated.
© 1969 Optical Society of America
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