Abstract

The theoretical background for a type of common path interferometer, the so-called axial twist interferometer, is discussed. Two devices capable of producing axially twisted bundles of rays are illustrated. Applications of the system are suggested with particular reference to interference microscopy. A simpler, related device, the planar inversion interferometer, is also described, and the characteristics and applicability of the two instruments are compared.

© 1968 Optical Society of America

A Measuring Interferometer for High Accuracy Alignment

Robert O. Naess
Appl. Opt. 7(11) 2315-2317 (1968)

A High Resolution Scanning Confocal Interferometer

J. R. Johnson
Appl. Opt. 7(6) 1061-1072 (1968)

Formation and Inversion of Pseudoscopic Images

C. B. Burckhardt, R. J. Collier, and E. T. Doherty
Appl. Opt. 7(4) 627-631 (1968)

The Spherical Mirror Fabry-Perot Interferometer

Michael Hercher
Appl. Opt. 7(5) 951-966 (1968)

Optics in a Hostile Environment

J. Dyson
Appl. Opt. 7(4) 569-580 (1968)