Abstract

It is shown that, if Fabry–Perot interferometers are to be used for the measurement of doppler widths of emission lines, exact knowledge of the plate reflectivity is required so that synthetic profiles may be calculated. If hyperfine structure or isotope structure is present, the data reduction may be tedious. It is shown that electronic analysis of the signal generated by a scanning interferometer will lead directly to a displayed measurement of the doppler temperature, and that the effects of hyperfine structure, isotope structure, Lorentz broadening, nonflatness of the plates and the finite size of the scanning aperture may all be compensated exactly. The performance in marginal circumstances has been calculated using the derived equations, and the system is shown to be capable of high accuracy.

© 1967 Optical Society of America

Measurement of Absorption-Line Profiles with a Fabry–Perot Interferometer*

Robert J. Hull and Lee C. Bradley
J. Opt. Soc. Am. 57(1) 11-18 (1967)

A Technique for Recovering Doppler Line Profiles from Fabry-Perot Interferometer Fringes of Very Low Intensity

P. B. Hays and R. G. Roble
Appl. Opt. 10(1) 193-200 (1971)

Doppler line profile analysis for a multichannel Fabry-Perot interferometer

Timothy L. Killeen and P. B. Hays
Appl. Opt. 23(4) 612-620 (1984)

Analytical description of a Fabry-Perot spectrometer. 5: Optimization for minimum uncertainties in the determination of Doppler widths and shifts

G. Hernandez
Appl. Opt. 18(22) 3826-3834 (1979)

A Two-Channel Fabry-Perot Interferometer for the Measurement of Doppler Temperatures

Peter Platz
Appl. Opt. 6(7) 1205-1207 (1967)