Abstract

A working design of a simple retardance meter is indicated. The device permits direct, quick, and accurate measurement of the retardance, for example, of an oriented polymeric film which is intended for use as a phase changer plate in the production of elliptically polarized light. The method involves the direct compensation of the sample’s retardance using the calibrated retardance of a mica crystal which is variably tilted about one of its two principal planar axes. Several suggestions relating to the optical design, assembly, and calibration of the device are included.

© 1967 Optical Society of America

Ellipsometry Using a Retardation Plate as Compensator*

W. G. Oldham
J. Opt. Soc. Am. 57(5) 617-624 (1967)

Practical Design of Infrared Detector Circuits

T. Berger and E. Brookner
Appl. Opt. 6(7) 1189-1193 (1967)

Accurate alignment of optical axes of a biplate using a spectroscopic Mueller matrix ellipsometer

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A Streak Spectrograph with Microsecond Resolution

D. E. Buttrey
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