Abstract
In this work, we derive closed-form expressions for determination of the linear birefringence and linear dichroism of uniaxial crystals utilizing transmission ellipsometry measurements at small angles of incidence in $ c $-cut crystal substrates. The model-free method we use is an algebraic generalization of the method reported in Appl. Opt. 44, 3153 (2005). [CrossRef] The optical anisotropy of substrates of sapphire, 4H-SiC, and 6H-SiC single crystals is measured for illustration.
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