Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Experimental studies of the transmission of light through low-coverage regular or random arrays of silica micropillars supported by a glass substrate

Not Accessible

Your library or personal account may give you access

Abstract

The transmission of light through low-coverage regular and random arrays of glass-supported silica micropillars of diameters 10–40 µm and height 10 µm is studied experimentally. Angle-resolved measurements of the transmitted intensity are performed at visible wavelengths by either a goniospectrophotometer or a multimodal imaging (Mueller) polarimetric microscope. It is demonstrated that for the regular arrays, the angle-resolved measurements are capable of resolving many of the densely packed diffraction orders that are expected for periodic structures of lattice constants 20–80 µm, but they also display features (“halos” and fringes) that are due to the scattering and guiding of light in individual micropillars or in the supporting glass slides. These latter features are also found in angle-resolved measurements on random arrays of micropillars of the same surface coverage. Finally, we perform a comparison of direct measurements of haze in transmission for our patterned glass samples with what can be calculated from the angle-resolved transmitted intensity measurements. Good agreement between the two types of results is found, which testifies to the accuracy of the angle-resolved measurements that we report.

© 2019 Optical Society of America

Full Article  |  PDF Article
More Like This
Design and characterization of a versatile reference instrument for rapid, reproducible specular gloss measurements

Jian Liu, Mario Noël, and Joanne Zwinkels
Appl. Opt. 44(22) 4631-4638 (2005)

Spatial variant gloss measurement of dielectric materials based on a polarized camera

Tsung-Lin Lu and Tzung-Han Lin
Appl. Opt. 62(32) 8686-8695 (2023)

Demonstration of resolving power λ/Δλ > 10,000 for a space-based x-ray transmission grating spectrometer

Ralf K. Heilmann, Jeffery Kolodziejczak, Alexander R. Bruccoleri, Jessica A. Gaskin, and Mark L. Schattenburg
Appl. Opt. 58(5) 1223-1238 (2019)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (10)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (3)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.