Abstract

This paper introduces an integrated fiber physical unclonable function (PUF) verification system based on a semiconductor laser source at substantially lower complexity and cost than existing alternatives. A source sub-section consisting of a linear frequency-swept semiconductor laser is used in combination with an optical frequency domain reflectometry (OFDR)/LiDAR-based measurement sub-section in order to conduct fiber identification via measurement of the unique Rayleigh reflection pattern of a section of optical fiber. When using these Rayleigh reflection patterns as PUFs, this technique results in a maximum equal error rate (EER) of 0.15% for a 5-cm section of optical fiber and an EER of less than 1% for a 4-cm section. These results demonstrate that the system can serve as a robust method fiber identification for device and communication verification applications.

© 2019 Optical Society of America

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