Determination of the laser beam quality factor (M<sup>2</sup>) by stitching quadriwave lateral shearing interferograms with different exposures

Zhi-Gang Han; Ling-Qiang Meng; Zhe-Qiang Huang; Hua Shen; Lei Chen; Ri-Hong Zhu

doi:10.1364/AO.56.007596

Determination of the laser beam quality factor (M²) by stitching quadriwave lateral shearing interferograms with different exposures

Zhi-Gang Han, Ling-Qiang Meng, Zhe-Qiang Huang, Hua Shen, Lei Chen, and Ri-Hong Zhu

Applied Optics
Vol. 56,
Issue 27,
pp. 7596-7603
(2017)
•https://doi.org/10.1364/AO.56.007596

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Zhi-Gang Han, Ling-Qiang Meng, Zhe-Qiang Huang, Hua Shen, Lei Chen, and Ri-Hong Zhu, "Determination of the laser beam quality factor (M²) by stitching quadriwave lateral shearing interferograms with different exposures," Appl. Opt. 56, 7596-7603 (2017)

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Related Topics
Table of Contents Category
- Lasers and Laser Optics
Optics & Photonics Topics
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The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
Previously assigned OCIS codes
- Instrumentation, measurement, and metrology (120.0120)
- Interferometry (120.3180)
- Lasers and laser optics (140.0140)
- Laser beam characterization (140.3295)

About this Article
History
- Original Manuscript: June 5, 2017
- Revised Manuscript: August 12, 2017
- Manuscript Accepted: August 20, 2017
- Published: September 14, 2017

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Abstract

A complete complex amplitude reconstruction method for the determination of the laser beam quality factor $M^{2}$ based on the multiple exposure of a quadriwave lateral shearing interferometer (QWLSI) is presented. The theoretical analysis and simulation of the influence of the information in the small signal area on the calculation of the $M^{2}$ factor is provided. The experimental results demonstrate that the new method can be an accurate means to measure the $M^{2}$ factor. The proposed method can avoid the influence of phase inaccuracy in the small signal area of the interferogram, during the measurement of the $M^{2}$ factor.

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Times	Proposed Method			Superposition Method
Times	1	2	3	1	2	3
$M^{2}$	2.740	2.021	1.588	2.897	2.543	2.392

EI/MI	0%	1%	2%	3%	4%	5%	6%	7%	8%
$Δ P V (λ)$	0.8	0.1	0.05	0.03	0.03	0.02	0.01	0.01	0.01

	$M^{2} (x)$	$M^{2} (y)$
Beam quality analyzer	1.06	1.04
Proposed method	1.11	1.06
Method 1	1.18	1.10
Method 2	1.30	1.24

	$M^{2} (x)$	$M^{2} (y)$
Beam quality analyzer	1.07	1.01
Proposed method	1.18	1.01
Method 1	1.31	1.01
Method 2	1.49	1.31

Times	Proposed Method			Superposition Method
Times	1	2	3	1	2	3
$M^{2}$	2.740	2.021	1.588	2.897	2.543	2.392

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