Abstract

The validity of real and complex equivalent refractive index models (ERIMs) is verified for a shielding effectiveness evaluation of high-transmittance double-layer metallic meshes. Theoretical and experimental studies show that the real ERIM is invalid for thin substrates and inaccurate for thick substrates for double-layer meshes, although it has long been used successfully for single-layer meshes. However, the complex ERIM shows more reasonable results not only for double-layer but also for single-layer meshes, and the evaluation accuracy is further improved by modifying the equivalent reactance coefficient using least-squares fitting. Therefore, the modified complex ERIM is applicable in most conditions.

© 2016 Optical Society of America

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