Abstract

The depth of field of an optical system can be extended through a combination of point spread function (PSF) engineering and image processing. A phase mask inserted in the back aperture of the system creates a PSF that is focus-invariant over an extended depth. A digital deconvolution is then used to restore transverse resolution. The application and analysis of this technique to fluorescence microscopy is limited in the literature. In this paper we formalize a microscopy specific imaging model, and experimentally demonstrate a total variation regularized deconvolution approach. Results are compared to the Wiener filter.

© 2015 Optical Society of America

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Corrections

22 February 2016: A correction was made to Ref. 27.


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