Abstract

We propose a kind of wavefront sensing technique by means of binary intensity modulation. A digital micromirror device operates as a binary intensity modulator and a pinhole works as a binary-aberration-mode filter. Through modulating intensity distribution of incident light, light emitting from the pinhole is capable of containing information on binary aberration coefficients. With the amount of light acquired by a single detector, the coefficients of binary aberration modes for reconstructing incident wavefront can be calculated. Differing from the conventional wavefront sensing technique, this method turns the complex two-dimensional wavefront sensing into simple total-light-intensity detection. The simulation experiment has validated the feasibility of the theoretical model.

© 2014 Optical Society of America

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