Abstract

Instead of measuring the wavefront deformations, Hartmann and Shack–Hartmann tests measure wavefront slopes, which are equivalent to ray transverse aberrations. Numerous integration methods have been described in the literature to obtain the wavefront deformations from these measurements. Basically, they can be classified in two different categories, i.e., modal and zonal. Frequently, a least squares fit of the transverse aberrations in the x direction and a least squares fit of the transverse aberrations in the y direction is performed to obtain the wavefront. In this work, we briefly describe a modal method to integrate Hartmann and Shack–Hartmann patterns by means of a single least squares fit of the transverse aberrations simultaneously instead of the traditional xy separate method. The proposed method uses monomial calculation instead of using Zernike polynomials, to simplify numerical calculations. Later, a method is proposed to convert from monomials to Zernike polynomials. An important obtained result is that if polar coordinates are used, angular transverse aberrations are not actually needed to obtain all wavefront coefficients.

© 2014 Optical Society of America

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Corrections

Geovanni Hernández-Gómez, Daniel Malacara-Doblado, Zacarías Malacara-Hernández, and Daniel Malacara-Hernández, "Modal processing of Hartmann and Shack–Hartmann patterns by means of a least squares fitting of the transverse aberrations: erratum," Appl. Opt. 54, 1870-1871 (2015)
http://proxy.osapublishing.org/ao/abstract.cfm?uri=ao-54-8-1870

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