Abstract
The preparation of dielectric multilayer coatings of nonequal thicknesses poses a problem of close control. The procedures of optical control of the coating itself (measurement of R or T extremes of R or T zeros of dR/dλ, usually reserved for λ/4 stacks) may also be used here; a preliminary study with the aid of an analog computer allows one to foresee progressively the different stages and to choose for each of the layers, the most precise method. The experimental results agree with the predicted.
© 1966 Optical Society of America
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