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Optical zooming interferometer for subnanometer positioning using an optical frequency comb

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Abstract

A high-precision positioning stage based on an optical zooming interferometer is proposed. Two external-cavity diode lasers, stabilized to a femtosecond optical frequency comb, are used as optical sources. The zooming principle is demonstrated, and the positioning resolution of 0.2nm is achieved. The positioning accuracy was partly evaluated.

© 2010 Optical Society of America

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