Abstract

We present what is believed to be a novel experimental method to measure the technological parameters (spectral response and quantum yield) of an infrared focal plane array. This method makes original use of a Fourier transform spectrometer, which allows us to simultaneously extract the spectral performances of all pixels from one single set of measurements. The methodology used and the principle of the experimental setup are detailed. A Fourier analysis is shown to provide various optogeometrical information on the detector microstructure. A demonstrator based on the HgCdTe technology was designed, and satisfactory experimental results were obtained.

© 2007 Optical Society of America

Angular acceptance analysis of an infrared focal plane array with a built-in stationary Fourier transform spectrometer

Frédéric Gillard, Yann Ferrec, Nicolas Guérineau, Sylvain Rommeluère, Jean Taboury, and Pierre Chavel
J. Opt. Soc. Am. A 29(6) 936-944 (2012)

Infrared focal plane array with a built-in stationary Fourier-transform spectrometer: basic concepts

Sylvain Rommeluère, Nicolas Guérineau, Riad Haidar, Joël Deschamps, Eric De Borniol, Alain Million, Jean-Paul Chamonal, and Gérard Destefanis
Opt. Lett. 33(10) 1062-1064 (2008)

Coherent imaging with two-dimensional focal-plane arrays: design and applications

Marc L. Simpson, Chuck A. Bennett, Mike S. Emery, Don P. Hutchinson, Gordon H. Miller, Roger K. Richards, and David N. Sitter
Appl. Opt. 36(27) 6913-6920 (1997)

Software field widening of a Fourier-transform spectrometer using a large focal plane array

Simon A. Roy, Simon Potvin, and Jérôme Genest
Appl. Opt. 47(34) 6470-6476 (2008)

Mercury cadmium telluride focal-plane array detection for mid-infrared Fourier-transform spectroscopic imaging

L. H. Kidder, I. W. Levin, E. Neil Lewis, V. D. Kleiman, and E. J. Heilweil
Opt. Lett. 22(10) 742-744 (1997)