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Electromagnetic field for a tightly focused beam incident upon ordinary and layered plane surfaces

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Abstract

A solution procedure is developed for the determination of the electromagnetic field that results from the interaction of a tightly focused beam with a plane surface with and without a layer. The effects of angle of incidence, relative index of refraction, polarization, layer thickness, and incident beam profile on the resulting electromagnetic field distribution are demonstrated.

© 2007 Optical Society of America

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