Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Sinusoidal wavelength-scanning interferometric reflectometry

Not Accessible

Your library or personal account may give you access

Abstract

We propose interferometric reflectometry in which a sinusoidal wavelength-scanning tunable laser diode is used to detect positions and profiles of multiple reflecting surfaces. An objective signal extracted from an interference signal contains modulation amplitude Z and phase α, which are related to the positions and profiles, respectively, of multiple reflecting surfaces. By using values of the objective signal at special times, we can produce an image intensity that shows where the reflecting surfaces exist. To obtain exact values of Z or values of α, we estimated the objective signal by using a conjugate gradient method. Experimental results show that a resolution of two-optical-path difference (OPD) in the image intensity is ∼60 µm, and the final OPD precisions are 2 and 8 µm for two and three reflecting surfaces, respectively, for a wavelength-scanning width of 7 nm. Profiles of the front and rear surfaces of a silica glass plate with a thickness of 20 µm have been measured with a precision of ∼10 nm.

© 2000 Optical Society of America

Full Article  |  PDF Article
More Like This
Sinusoidal wavelength-scanning interferometer with a superluminescent diode for step-profile measurement

Osami Sasaki, Norihiko Murata, and Takamasa Suzuki
Appl. Opt. 39(25) 4589-4592 (2000)

Tomographic imaging by two-wave mixing with a wavelength-scanning laser diode

Osami Sasaki, Junichi Yamagishi, Takeshi Manabe, and Takamasa Suzuki
Opt. Lett. 25(16) 1174-1176 (2000)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (14)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (14)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved