Abstract
The m-lines technique is used to measure the refractive
indices and thicknesses of layers embedded in a multilayer
stack. The multilayer considered is deposited by ion
plating. Its formula is silica–4H–L–4H–L–6H–air,
where H and L denote
Ta2O5 and SiO2λ/4 layers,
respectively, with λ = 514.5 nm. Measurements indicate that
the refractive index of Ta2O5 is 5 ×
10-3 greater when the layer is close to air than when the
layer is inside the coating and that the Ta2O5
is slightly more birefringent.
© 1999 Optical Society of America
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