Abstract
The optical properties of colored wing scales of the
Chrysiridia croesus moth were investigated experimentally
and theoretically by reflection spectroscopy and
ellipsometry. Transmission electron microscope micrographs show
that the outer surfaces of these scales incorporate a fairly regular
layered structure of alternating dense and less-dense material, which
reflects light by the well-known thin-film interference process. A
Monte Carlo–type simulation of the reflection process is discussed,
which permits the determination of the complex index of refraction of
the scale material.
© 1998 Optical Society of America
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