Abstract
A method for diagnosing a silver–dielectric interface is proposed.
This method relies on surface plasmon resonance at the Ag–dielectric
interface. It yields a good estimate of an air gap between a thin Ag film and
a polymer (dielectric). Detection of an air gap thickness of approximately
half of the incident probing beam wavelength was monitored. Probing a small
air gap is also discussed in the case of poor adhesion at the Ag–polymer
interface.
© 1997 Optical Society of America
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