Abstract

A standard tandem triple-pass scanning Fabry–Perot interferometer of the Vernier type for applications in the near infrared is described. The Fabry–Perot etalons have been coated with a specially designed dielectric multilayer stack with low loss factors and a uniform reflectivity of (92.5 ± 1.0)% between 730 and 860 nm. The performances of the instrument, such as resolution, total transmission, and contrast, are equivalent to conventional tandem Fabry–Perot spectrometers but over the whole near-infrared wavelength range. Applications of the system to Brillouin scattering on semiconductors in the transparent wavelength regime and high-resolution spectroscopy of vertical cavity surface-emitting lasers are given.

© 1997 Optical Society of America

Tandem multipass Fabry-Perot interferometer for Brillouin scattering

J. G. Dil, N. C. J. A. van Hijningen, F. van Dorst, and R. M. Aarts
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Pressure-scanned three-pass Fabry-Perot interferometer

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Line-shape studies for single- and triple-pass Fabry–Perot interferometer systems

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