Abstract

It is desirable for design purposes to model a signal-processing-in-the-element (SPRITE) detector simply as a discrete-element detector with an integration-enhanced D*. We present a method for normalization of measured D* for SPRITE detectors to yield an equivalent-discrete D*. The multiplicative factor is the square root of the ratio of two noise-equivalent bandwidths: one is that of the SPRITE detector with no boost filter, and the other is that of the SPRITE detector with a boost filter that approximately compensates for carrier diffusion, yielding a spatial resolution that approaches that of a discrete detector the same size as the readout. This approach allows a resolution-equivalent D* comparison of SPRITE detectors with discrete-element detectors and facilitates such comparisons among SPRITE detectors. We find that, to obtain the D* of an equivalent-discrete detector, a measured SPRITE D* should typically be multiplied by a factor ranging from 0.85 to 0.57 for 8- to 12-μm SPRITE detectors and by a factor ranging from 0.50 to 0.23 for 3- to 5-μm SPRITE detectors.

© 1995 Optical Society of America

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