Abstract

The modulated reflected and nonreflected light fluxes, measured as the azimuth of incident linearly polarized light is varied, yield the absolute reflectances R_p and R_s of a dielectric or semiconductor surface. Application to a reflective Si detector determines the refractive index and thickness of a SiO₂ film on the detector surface.

© 1994 Optical Society of America

Reflectometer for absolute silicon radiometry

James L. Gardner
Appl. Opt. 30(16) 2067-2068 (1991)

Optical polarization switching in a Fabry–Perot étalon that utilizes the photoinduced Kerr effect

C. H. Kwak, W. Y. Hwang, J.-S. Jeong, H. H. Suh, and E.-H. Lee
Appl. Opt. 33(15) 3189-3191 (1994)

Monte Carlo simulation of light transport in tissue: unscattered absorption events

Craig M. Gardner and A. J. Welch
Appl. Opt. 33(13) 2743-2745 (1994)

Scale-invariant binary phase-only matched filter using a ferroelectric-liquid-crystal spatial light modulator

T. D. Wilkinson, D. C. O’Brien, and R. J. Mears
Appl. Opt. 33(20) 4452-4453 (1994)

Visible optical parametric generator producing nearly bandwidth-limited femtosecond light pulses at 1 -kHz repetition rate

Valentin Petrov, Frank Seifert, and Frank Noack
Appl. Opt. 33(30) 6988-6991 (1994)