1A majority of this research was performed while the authors were with the Laboratory for Atmospheric and Space Physics, University of Colorado, Boulder, Boulder, Colorado 80309.
2G. Rottman is now with the High Altitude Observatory, National Center for Atmospheric Research, P.O. Box 3000, Boulder, Colorado 80307.
3S. Osterman is now with the Naval Research Laboratory, 4555 Overlook Avenue, S.W., Washington, D.C. 20375.
Steve Osterman and Gary J. Rottman, "Photometric calibration of the first three spectroscopic orders of an extreme-ultraviolet spectrometer by use of synchrotron radiation," Appl. Opt. 33, 4193-4200 (1994)
We report here a technique for determining the quantum throughput of a high-resolution, extreme-UV spectrometer by use of the National Institute of Standards and Technology’s Synchroton Ultraviolet Radiation Facility at Gaithersburg, Md. (SURF-II). Observations were obtained at three different synchrotron operating energies with and without a magnesium fluoride filter and a tin–germanium filter. This calibration permits us to extract system efficiencies for three overlapping spectroscopic orders with uncertainties of 10–30%. The uncertainties quoted in this preliminary experiment were limited by the available time, and we propose that with minor refinements a significant improvement could be realized.
John F. Seely, Charles M. Brown, Glenn E. Holland, Frederick Hanser, John Wise, James L. Weaver, Raj Korde, Rodney A. Viereck, Richard Grubb, and Darrell L. Judge Appl. Opt. 40(10) 1623-1630 (2001)
Ping-Shine Shaw, Uwe Arp, Robert D. Saunders, Dong-Joo Shin, Howard W. Yoon, Charles E. Gibson, Zhigang Li, Albert C. Parr, and Keith R. Lykke Appl. Opt. 46(1) 25-35 (2007)
Ping-Shine Shaw, Keith R. Lykke, Rajeev Gupta, Thomas R. O’Brian, Uwe Arp, Hunter H. White, Thomas B. Lucatorto, Joseph L. Dehmer, and Albert C. Parr Appl. Opt. 38(1) 18-28 (1999)
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Ref. 19.
Nominal electron-beam energies are 140, 180, and 284 MeV. The synchrotron bending radius is 0.8382 m, and the distance from the storage ring tangent to the milling table gimbal axis is 11.596 m. The spectrometer entrance slit is 0.079 mm high by 0.031 mm wide.
Uncertainties in the operating parameters of SURF-II are discussed in Refs. 4–7.
The uncertainty in these quantities varies both with wavelength and with electron-beam energy. The extreme values are cited.
Table 3
Comparison of Modified Polarization Ratios Calculated by Two Calibration Techniques
Calibration Technique
MgF2 direct beam
2.63 ± 0.53
SnGe foil filter
2.65 ± 1.12
Note: By comparing the relative polarization of the two orientations and two spectroscopic orders rather than calculating the individual polarizations for each order, we will cancel any systematic errors in measuring the transmittance of the SnGe filter.
Tables (3)
Table 1
First-, Second-, and Third-Order Quantum Throughputs and Corresponding Uncertainties for Each Pixel Rangea
Pixel Range
Order
Central Quantum Throughput
Mean Quantum Throughput
Perpendicular orientation
0–160 (CsI-treated MCP)
1
5.0 (±0.3) × 10−3
3.9 (±1.3) × 10−3
2
5.1 (±0.9) × 10−3
3.9 (±0.8) × 10−3
3
6.3 (±1.1) × 10−3
3.4 (±0.7) × 10−3
170–315 (Bare MCP)
1
4.5 (±0.4) × 10−5
3.4 (±0.9) × 10−5
2
1.9 (±0.2) × 10−3
1.5 (±0.2) × 10−3
3
3.3 (±0.3) × 10−3
1.7 (±0.2) × 10−3
325–505 (CsI-treated MCP)
1
5.3 (±0.3) × 10−3
4.3 (±1.3) × 10−3
2
5.4 (±0.9) × 10−3
4.2 (±0.8) × 10−3
3
6.9 (±1.2) × 10−3
3.7 (±0.8) × 10−3
515–1000 (Bare MCP)
1
4.0 (±0.3) × 10−5
3.3 (±0.6) × 10−5
2
1.8 (±0.2) × 10−3
1.4 (±0.1) × 10−3
3
3.3 (±0.3) × 10−3
1.7 (±0.2) × 10−3
Parallel orientation
0–160 (CsI-treated MCP)
1
5.2 (±0.3) × 10−3
4.8 (±1.2) × 10−3
2
5.8 (±1.2) × 10−3
3.1 (±0.7) × 10−3
3
2.0 (±0.4) × 10−3
2.0 (±0.7) × 10−3
170–315 (Bare MCP)
1
4.8 (±0.4) × 10−5
2.6 (±0.5) × 10−5
2
2.4 (±0.2) × 10−3
1.3 (±0.1) × 10−3
3
1.6 (±0.2) × 10−3
1.6 (±0.2) × 10−3
325–505 (CsI-treated MCP)
1
6.1 (±0.3) × 10−3
5.2 (±1.4) × 10−3
2
6.6 (±1.0) × 10−3
3.5 (±0.8) × 10−3
3
2.7 (±0.6) × 10−3
3.8 (±0.6) × 10−3
515–1000 (Bare MCP)
1
4.7 (±0.3) × 10−5
2.4 (±0.4) × 10−5
2
2.3 (±0.2) × 10−3
1.2 (±0.1) × 10−3
3
1.4 (±0.2) × 10−3
1.6 (±0.2) × 10−3
Mean values are based on 13 position spectrometer maps.
Ref. 19.
Nominal electron-beam energies are 140, 180, and 284 MeV. The synchrotron bending radius is 0.8382 m, and the distance from the storage ring tangent to the milling table gimbal axis is 11.596 m. The spectrometer entrance slit is 0.079 mm high by 0.031 mm wide.
Uncertainties in the operating parameters of SURF-II are discussed in Refs. 4–7.
The uncertainty in these quantities varies both with wavelength and with electron-beam energy. The extreme values are cited.
Table 3
Comparison of Modified Polarization Ratios Calculated by Two Calibration Techniques
Calibration Technique
MgF2 direct beam
2.63 ± 0.53
SnGe foil filter
2.65 ± 1.12
Note: By comparing the relative polarization of the two orientations and two spectroscopic orders rather than calculating the individual polarizations for each order, we will cancel any systematic errors in measuring the transmittance of the SnGe filter.