Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry

Abstract

A novel measurement technique based on phase-stepping microinterferometry is proposed for the refractive-index profiling of planar waveguides fabricated by ion exchange in glass. The sample preparation simplicity and easy instrumental implementation, together with high accuracy and improved resolution, are argued.

© 1994 Optical Society of America

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