Abstract

A new numrical method is described for analysis of the imaging properties of microlenses. This wave-propagation method is compared with the classical beam-propagation method from which it is derived. The applicability of the two methods is given and demonstrated by examples. The beam-propagation method is fast but is applicable only for small apertures; the new wave-propagation method requires no paraxial approximation but requires more computational effort.

© 1993 Optical Society of America

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