Abstract

This paper presents a recursive formulation for the evaluation of the transverse Kerr magnetooptic response of a multilayer stack containing an arbitrary number of magnetic and dielectric materials. The magnetooptic effects were formulated using the first-order perturbation theory. Fresnel reflectance and transmittance coefficients were derived for an interface between two magnetic thin films. These coefficients were used to derive recursive expressions for stack reflectance and transmittance. Equations are provided for the determination of nonreciprocal reflectance and phase shift due to film magnetization.

© 1989 Optical Society of America

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