Abstract

Scattering properties of nineteen single layer titania films are presented. These films are among those prepared for the 1986 Optical Society of America Annual Meeting and were made using six different deposition techniques. The properties are given in terms of total integrated scattering and the bidirectional reflectance distribution function. We looked for a relationship between scattering properties and microstructure. Our measurements indicate a strong influence by the substrate which greatly limits the conclusions that can be drawn. Measurements and theoretical analysis demonstrate that some samples have short period defects incorporated in the film.

© 1989 Optical Society of America

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