Abstract

Statistical parameters, rms roughness δ and autocovariance length σ, are determined both for rough surfaces of CaF2 deposits and for surfaces of silver films deposited on these CaF2 underlayers. The dependence of δ and σ on the CaF2 film thickness d is investigated. It is shown that the silver films do not replicate well the CaF2 underlayers. A review of the relationships between δ, σ and d when seeking control of the roughness of a silver film by controlling d is proposed. It is also shown that CaF2 is a good underlayer compared with LiF.

© 1989 Optical Society of America

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