Abstract
A method for active polarization compensation for a scanning goniometer is presented. This is part of instrumentation constructed for measurements of light scattering by particulates in a high voltage spark. Individual optical element characterization is made using ellipsometry. Mueller matrix calculations are used to model the optical system. The inverse of the optical system is used to calculate the necessary input polarization state. A polarized source with angularly controlled halfwave and quarterwave retarders is used to introduce the necessary polarization state into the goniometer.
© 1988 Optical Society of America
Full Article |
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (10)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Tables (2)
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (52)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription