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Ellipsometry with rotating plane-polarized light

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Abstract

The polarization plane of a laser beam is made to rotate at high frequency with the help of a special setup containing wave plates and an acoustooptic modulator. The application of this beam for ellipsometric measurements is investigated and a number of applications are proposed. We describe some novel approaches for the analysis of thin films and optical surfaces and for measurements on static and time-varying anisotropic phenomena such as the electrooptic effect, optical activity, and strain analysis using the photoelastic effect.

© 1986 Optical Society of America

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