Abstract

A method is described to obtain the permittivity tensor of a magnetooptic layer in a multilayer film by phase modulated ellipsometry. It is shown that the phase difference caused by oblique incidence reflection can be separated from the phase difference caused by the magnetooptic effect by selecting the angle of the analyzer, i.e., a Wollaston prism and a dual detector. A numeric method is described to extract the optical constants from the measured quantities.

© 1986 Optical Society of America

Magnetooptic ellipsometry in multilayers at arbitrary magnetization

Š. Višňovský, R. Lopušník, M. Bauer, J. Bok, J. Fassbender, and B. Hillebrands
Opt. Express 9(3) 121-135 (2001)

Measurement of reflectivities for magnetooptical media

M. Ruane, M. Mansuripur, and R. Rosenvold
Appl. Opt. 25(12) 1946-1951 (1986)

Photoelastic properties of metals measured by off-null ellipsometry

Kjeld Pedersen and Ole Keller
Appl. Opt. 25(2) 226-234 (1986)

Use of the 4 × 4 matrix method in the optics of multilayer magnetooptic recording media

Zhan-Ming Li, Brian T. Sullivan, and R. R. Parsons
Appl. Opt. 27(7) 1334-1338 (1988)

Reflectivity, rotation, and ellipticity of magnetooptic film structures

Gerard J. Sprokel
Appl. Opt. 23(22) 3983-3989 (1984)