Abstract

An approximate analysis has been worked out to determine the optical admittance of an all-dielectric multilayer stack at wavelengths not too far away from the monitoring wavelength at which the layers are quarterwave thick. The expression, so obtained, is found to be useful in designing broadband antireflection coatings and interference filters.

© 1986 Optical Society of America

General expression for the reflectance of an all-dielectric multilayer stack

B. S. Verma, A. Basu, R. Bhattacharyya, and V. V. Shah
Appl. Opt. 27(19) 4110-4116 (1988)

Optical monitoring of nonquarterwave layers of dielectric multilayer filters using optical admittance

Byung Jin Chun, Chang Kwon Hwangbo, and Jong Sup Kim
Opt. Express 14(6) 2473-2480 (2006)

Multilayer coatings monitoring using admittance diagram

Cheng-Chung Lee and Yu-Jen Chen
Opt. Express 16(9) 6119-6124 (2008)

Whispering gallery modes of a curved antiresonant reflecting optical waveguide

Lifu Gong, Qu Li, Yingli Chen, and Xianfeng Chen
Appl. Opt. 36(9) 1902-1905 (1997)

Scatter from fluid patches in optical thin-film coatings

John R. Gee, Ian J. Hodgkinson, and Peter W. Wilson
Appl. Opt. 25(16) 2688-2694 (1986)