Abstract

Electronic speckle pattern interferometry with a cw laser has been used to study objects at very high temperatures. Interference patterns were observable to 1700°C, while high contrast interference fringes could be recorded up to 1550°C. These temperature limits were mainly set by the onset of surface reactions and melting of the objects. Examples on how the technique can be used to study deformations, oxidation shell growth, and melting zones are presented.

© 1985 Optical Society of America

Interferometric comparison of displacements by electronic speckle pattern interferometry

Ole J. Løkberg and Gudmunn Å. Slettemoen
Appl. Opt. 20(15) 2630-2634 (1981)

Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera

Andrew J. Moore, Duncan P. Hand, Jim S. Barton, and Julian D. C. Jones
Appl. Opt. 38(7) 1159-1162 (1999)

Detection and measurement of small vibrations using electronic speckle pattern interferometry

Kåre Høgmoen and Ole J. Løkberg
Appl. Opt. 16(7) 1869-1875 (1977)

Measurement of plant movement in young and mature plants using electronic speckle pattern interferometry

Astrid Aksnes Dyrseth
Appl. Opt. 35(19) 3695-3701 (1996)

Fringe scanning speckle-pattern interferometry

Suezou Nakadate and Hiroyoshi Saito
Appl. Opt. 24(14) 2172-2180 (1985)