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Surface profile measurement from intensity of diffracted light using the phase retrieval method

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Abstract

The optical surface profile is derived from the intensity distribution of the light diffracted by the surface roughness using phase retrieval techniques. This method is applied to a surface of periodic roughness such as a diamond-turned metal surface. Computer simulations and experimental results make it clear that the method is useful for a surface whose root-mean-square roughness is more than ~30 Å.

© 1985 Optical Society of America

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