Abstract

This paper details the error considerations in the design and construction of a two-layer antireflection coating on KCl. Methods of choosing the most appropriate design, which allows the production of a practical coating of low absorptance and reflectance, are discussed. Experimental methods of minimizing layer-thickness errors are also discussed. These methods have been applied to the production of a chalcogenide glass two-layer coating consisting of Ge30As17Te30Se23 and As2S3. Both the reflectance and absorptance of this coating were found to be 0.02% at the design wavelength of 10.6 μm.

© 1980 Optical Society of America

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