Abstract

Chromaticity measurements of three different types of retroreflective material in six common colors are presented. A computer controlled spectroradiometric retroreflectometer system with sample goniometer was employed for the measurements. Geometry-caused chromaticity changes were as great as 0.05 in x and y. Color differences in both CIELUV and CIELAB computed from a base geometry of α = 0.2 and β = −4° attained values as high as 50 units for some materials. The total color extent of each material is plotted from a 4 × 4 measurement matrix of angles. The paper concludes with the locations of the measured material plotted on the CIE 1931 diagram.

© 1980 Optical Society of America

Factors affecting the metrology of retroreflecting materials

William H. Venable, H. F. Stephenson, and Heinz Terstiege
Appl. Opt. 19(8) 1242-1246 (1980)

Unified coordinate system for retroreflectance measurements

William H. Venable and Norbert L. Johnson
Appl. Opt. 19(8) 1236-1241 (1980)

NBS reference retroreflectometer

Kenneth L. Eckerle, Jack J. Hsia, Victor R. Weidner, and William H. Venable
Appl. Opt. 19(8) 1253-1259 (1980)

Retroreflection measurements: a review

J. J. Rennilson
Appl. Opt. 19(8) 1234-1235 (1980)

Influence of aperture size on the photometry of retroreflectors

Norbert L. Johnson and H. F. Stephenson
Appl. Opt. 19(8) 1247-1252 (1980)